The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. Its extremely compact size and modularity have allowed the creation of a PXI version, allowing the eloZ1 test functionality to be easily integrated into PXI systems. The picture shows an example of an eloZ1-PXI test system with additional functional test hardware.

Hardware Architecture

The eloZ1 is designed as a modular system. It can be customized to the respective test application.

Stimulus Unit

  • The analog section is galvanically isolated from the digital section.
  • Each generator has its own power supply.
  • The stimulus unit can be used as a voltage source or as a current source.
  • Basic version: up to ±10 V and up to ±1 A.
  • Sense lines allow precision measurements with controlled voltage at the UUT.
  • Current and voltage are measured dynamically and simultaneously.

Switching Matrix

  • A multiplexer joins the eight internal analog rails to four rails.
  • A full matrix connects the four rails to the test pins.
  • Maximum 320 test pins in the PXI version.


  • Functional tests
  • Programming of Flash IC's etc
  • Boundary Scan

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